Meaning
Analytical electron microscopy techniques determine crystallographic phase distribution and grain orientation across polished material cross-sections. Materials engineers perform EBSD phase mapping to evaluate phase transformation and localized strain in duplex stainless steels and titanium alloys. The technique measures backscattered electron diffraction patterns to map microstructural phases at sub-micron scales.
Measurement scope stops at the physical surface layer, requiring careful mechanical and chemical polishing to remove surface damage.
Microstructural Resolution
High-resolution mapping identifies secondary phases such as strain-induced martensite or intermetallic sigma phase within matrix grains. Automated indexing software compares diffracted kikuchi patterns against crystal structure databases to classify phases at every scan point. Quantitative phase fractions reveal whether thermal processing or mechanical working met specified manufacturing parameters.
Unmapped points indicate severe local lattice distortion or surface contamination.
Strain Detection
Localized crystal lattice misorientation highlights internal residual strain resulting from cold working or welding. Grain boundary mapping differentiates high-angle structural boundaries from low-angle subgrain networks. Material capability assessment relies on phase distribution maps to predict corrosion resistance and mechanical toughness.
Laboratory prototype scans guide manufacturing heat treatment parameter optimization.
Quality Verification
Receiving inspection protocols utilize phase quantification to verify raw material quality before component forging. Mill test certificates are cross-checked against independent diffraction analysis results.
